ENRE
600-Fundamentals of Failure Mechanisms
Introduction to the physics of failure and statistical tools needed to understand fundamental
physical processes that lead to failures. This course develops the
basic mathematical underpinnings of lifetime acceleration models
and approaches to analyzing data.
ENRE 661-Microelectronics Device Reliability
Semiconductor device physics of failure, designed for graduate
students with some background in semiconductor device operation
in addition to having had core courses in reliability. This course
incorporates the latest understanding of specific wear-out mechanisms.